Abstract: Impact of strain of sub-3 nm gate-all-around (GAA) CMOS transistors on the circuit performance is evaluated using a neural compact model. The model was trained using 3D technology ...
Abstract: As CMOS technology continues to scale, the associated reduction in device reliability margins has made accurate reliability evaluation a critical component of digital circuit design.
LogicDrawer is an interactive, web-based digital logic circuit designer and simulator. Perfect for students, educators, and engineers looking to design, simulate, and analyze digital circuits with ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback