Abstract: Wafer maps of large-scale integration chips are matrices showing the defective chip position on a wafer. Determining defect patterns on wafer maps is crucial because these patterns indicate ...

The 30-year-old system that classifies hair texture with letters and numbers overlooks science and enforces racial biases.

Abstract: During semiconductor manufacturing, wafer defect patterns emerge in an uncontrolled environment, making immediate recognition challenging. To enhance the classification accuracy in pattern ...