Abstract: Built in redundancy analysis (BIRA) is used in the manufacturing process for memory yield. However, as the memory density increases, fault occurrence in the memory process is increasing.

Abstract: Trillions of memory cells are fabricated into the fingertip area of a semiconductor wafer. Therefore, it is almost impossible to ensure that there will be no defects after manufacturing.

Are you the owner of a spankin' new Nintendo Switch 2 console? Have you been holding off on a memory card upgrade until prices have dropped? If you answered "yes" to both questions, then you, my ...

Four decades after an unknown disaster brought about the end of the world in 1986, pockets of humanity linger in the New York City subway tunnels. Some of these survivors compete in a gladiatorial ...